Multi-technique surface analysis for structural and chemical characterization of 2D materials
Two-dimensional (2D) materials such as graphene, hexagonal boron nitride, transition metal dichalcogenides, MXenes etc are currently at the forefront of materials research as they offer pathways to new technology, especially electronics.
These compounds allow scientists and researchers to create a new
library of materials by forming heterostructures of atomic layerthick materials, enabling the creation of tailored properties for specific applications. But the development and production of this new class of materials also requires advancement in the technologies to characterise such atomic-layer thick materials precisely.
The Nexsa Surface Analysis System uniquely integrates XPS with Raman spectroscopy that can be used to probe the identity, crystallinity, impurity, stress/strainor thickness of a 2D material. With both techniques being co-incident, allowing analysis to be collected from the same position, the result is a more comprehensive analysis of the sample from on versatile instrument
Read the APPLICATION NOTE below to learn more!