Applications of spectroscopy in polymer packaging products

Microplastics Identification and Characterization with Molecular Spectroscopy and Microscopy

Nanodrop One spectrophotometer Applications

Analysis of Clinker and Cement using WDXRF

Analysis of fuel and crude oil

Analysis of fuel and crude oil with TE instruments

Comparison of BTEXS in Olive Oil by Static and Dynamic Ht3

Automating the Solid Phase Extraction of draft EPA Method 1633

Failure Analysis of Metallic Materials – SEM Applications

Application of Gas Adsorption Technology in the Tobacco Industry

Analysis of Lithium-Ion Batteries with XPS spectroscopy

How to Analyze Beer Color

Analysis of ilmenite ore samples

Analysis of Cement Clinker using ARL X’TRA CompanionBenchtop XRD

Ultra-fast analysis of micro inclusionsin aluminum and its alloys

Electronic Ceramics Analysis SEM

Quantum Diamond NV-center AFM Applications

CHNS/O Determination in rubber samples – material characterization

Improvement of meat oxidation stability by addition of natural products

Multiplexed pesticide analysis by GC-TQMS

Understanding the chemical and electronicproperties of OLED materials

Multi-technique surface analysisfor structural and chemicalcharacterization of 2D materials

Application of Gas Adsorption Technique in Pharmaceutical Powder Characterization

Cannabinoid Sample Preparation

Raman Analysis of Li-ion Batteries

Rapid infrared microscopy in pharmaceutical productdevelopment, quality control and biologics formulation

ATR FTIR spectroscopy for the forensic tracingof blood stain age

Multi-technique surface analysis for structural and chemical characterization of 2D materials

Two-dimensional (2D) materials such as graphene, hexagonal boron nitride, transition metal dichalcogenides, MXenes etc are currently at the forefront of materials research as they offer pathways to new technology, especially electronics.

These compounds allow scientists and researchers to create a new
library of materials by forming heterostructures of atomic layerthick materials, enabling the creation of tailored properties for specific applications. But the development and production of this new class of materials also requires advancement in the technologies to characterise such atomic-layer thick materials precisely.

The Nexsa Surface Analysis System uniquely integrates XPS with Raman spectroscopy that can be used to probe the identity, crystallinity, impurity, stress/strainor thickness of a 2D material. With both techniques being co-incident, allowing analysis to be collected from the same position, the result is a more comprehensive analysis of the sample from on versatile instrument

Read the APPLICATION NOTE below to learn more!