SEM 2000 Tungsten Filament Scanning Electron Microscope

The CIQTEK SEM2000 is a basic and versatile analytical tungsten filament scanning electron microscope with 20 kV resolution up to 3.9 nm and support for upgrading to 30 kV, allowing observation of microstructural information of sub-microscale samples.
It has a larger range of motion than a desktop / benchtop SEM and is suitable for rapid screening of samples, and has more expansion interfaces for BSED, EDS/EDX, and other accessories to enable a wider range of applications.