FIB – SEM DB500

FIB-SEM has many applications, such as:

• Analyzing, depositing, and removing materials in a specific location, especially for semiconductors and materials science.
• Making thin and high-quality samples for transmission electron microscopy (TEM) from different kinds of materials.
• Visualizing and characterizing structures below the surface and in 3D by alternating FIB cutting and SEM imaging.
• Creating and designing devices at the nanoscale by FIB carving and adding.